Tuning vacancy trapping by impurities in Si and Ge through high-throughput selection

M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier

ISBN/ISSN:

Poster

Conference / event / venue

EMRS Spring Meeting 2016

Lille, France

Monday, 2 May, 2016 to Friday, 6 May, 2016