Tuning Vacancy Trapping by Impurities in Si and Ge by High-Throughput Selection

M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier

ISBN/ISSN:

Talk

Conference / event / venue

IWMCG-8

Spa, Belgium

Sunday, 15 November, 2015 to Wednesday, 18 November, 2015