High-throughput screening of extrinsic point defect properties in Si and Ge

M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier

19

ISBN/ISSN:

Talk

Conference / event / venue

Euro-TMCS I

Granada, Spain

Wednesday, 28 January, 2015 to Friday, 30 January, 2015